A control chart for monitoring process mean based on attribute inspection

DOI10.1080/00207540601126770MaRDI QIDQ3518523zbMATH OpenOpenAlexFDO

Authors Zhang Wu, Jianxin (Roger) Jiao

Publication date 8 August 2008

Published in International Journal of Production Research (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/00207540601126770

zbMATH Keywords

attribute and variable control chartsattribute inspectionsconforming run lengthquality controlstatistical process control

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25)

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Cites work

• CUSUM Charts with Variable Sampling Intervals
• Design of the sum-of-conforming-run-length control charts
• The geometric CUSUM chart with sampling inspection for monitoring fraction defective

Cited in

(14)

• Some comments regarding the synthetic \(\overline{X}\) chart
• A combined synthetic\&X chart for monitoring the process mean
• The (α, β)-cut control charts for process average based on the generalised intuitionistic fuzzy number
• Optimal variable sample size and sampling interval MSE chart based on improved square root transformation
• A control chart to monitor the process mean based on inspecting attributes using control limits of the traditional X-bar chart
• Hybrid synthetic and group runs charts using alternating the charting statistic to monitor the mean vector of a multivariate process
• Transition probabilities and ARL performance of Six Sigma zone control charts
• A synthetic control chart for monitoring the small shifts in a process mean based on an attribute inspection
• Monitoring the process mean with an ATTRIVAR chart
• A Cause-Selecting Control Chart Method for Monitoring and Diagnosing Dependent Manufacturing Process Stages
• Globally applicable control chart for online monitoring of stability of process mean
• A new np _CEV chart for monitoring process mean shifts based on an attribute inspection
• Economic design of an attribute control chart for monitoring mean life based on multiple deferred state sampling
• Statistical computation and analyses for attribute events

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