A sequential bayes procedure for reliability demonstration

DOI10.1002/NAV.3800170105MaRDI QIDQ5598810zbMATH OpenOpenAlexFDO

Authors Ray E. Schafer, Nozer D. Singpurwalla

Publication date 1970

Published in Naval Research Logistics Quarterly (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1002/nav.3800170105

Cites work

• scientific article; zbMATH DE number 3305599 (Why is no real title available?)
• Simple estimators of the parameters of exponential distributions when samples are censored

Cited in

(4)

• Optimum component test plans for systems with dependent components
• Bayesian sequential reliability for Weibull and related distributions
• Advances in Bayesian decision making in reliability
• Exact computation for some sequential tests

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