A simple and efficient eM-algorithm for one-shot device data analysis

DOI10.1080/03610918.2025.2515193MaRDI QIDQ7238356zbMATH OpenFDO

Authors Xiaojun Zhu, Yanmin Li, Narayanaswamy Balakrishnan

Publication date 7 May 2026

Published in Communications in Statistics. Simulation and Computation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/03610918.2025.2515193

Mathematics Subject Classification ID

Statistics (62-XX)

Cites work

• Analysis of one-shot device testing data under logistic-exponential lifetime distribution with an application to SEER gallbladder cancer data
• On the choice of the optimal tuning parameter in robust one-shot device testing analysis
• OPTIMAL DESIGN OF SIMPLE STEP-STRESS ACCELERATED LIFE TESTS FOR ONE-SHOT DEVICES UNDER EXPONENTIAL DISTRIBUTIONS
• Optimum Accelerated Life Tests with a Nonconstant Scale Parameter
• Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution
• The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing

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