A transition sequence generator for RAM fault detection

DOI10.1109/12.2175MaRDI QIDQ3786421zbMATH OpenOpenAlexFDO

Authors Eric Regener

Publication date 1988

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/12.2175

zbMATH Keywords

graph modelingpattern-sensitive faultsRAM testingstuck-open faults

Mathematics Subject Classification ID

Applications of graph theory to circuits and networks (94C15)

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