A two-dimensional probability model for evaluating reliability of piezoelectric micro-actuators

DOI10.1016/J.IJFATIGUE.2006.03.016MaRDI QIDQ994028zbMATH OpenOpenAlexFDO

Authors Zhimin He, Han Tong Loh, Min Xie

Publication date 16 September 2010

Published in International Journal of Fatigue (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.ijfatigue.2006.03.016

zbMATH Keywords

reliabilityprobability distributiontemperaturefatigue lifepiezoelectric actuatorselectric strengthtwo-dimensional strength

Mathematics Subject Classification ID

Reliability and life testing (62N05) Electromagnetic effects in solid mechanics (74F15) Stochastic and other probabilistic methods applied to problems in solid mechanics (74S60)

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Cited in

(3)

• MLE solution research for a certain kind of two-dimensional lognormal distribution function
• Effects of electric and mechanical loads on the morphological evolution of a void in piezoelectric films
• Dynamic substructure model for multiple impact responses of micro/nano piezoelectric precision drive system

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