Accuracy characteristics for quantum process tomography using superconductor phase qubits
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Abstract: We propose a method for precision statistical control of quantum processes based on superconductor phase qubits. Using the universal quantum tomography method, we provide a detailed analysis of accuracy of tomography for a 2-qubit gate SQiSW, which arises due to capacitive coupling between qubits. The developed approach could be successfully applied for quality and efficiency problems of superconductor quantum information technologies.
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