Algorithms for Detection of Faults in Logic Circuits

DOI10.1109/T-C.1971.223125MaRDI QIDQ5631006zbMATH OpenFDO

Authors Willard G. Bouricius, Edward P. Hsieh, Gianfranco R. Putzolu, J. Paul Roth, Peter R. Schneider, Chung-Jen Tan

Publication date 1971

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/T-C.1971.223125

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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