An Image Analysis Problem in Electron Microscopy

DOI10.2307/2291713MaRDI QIDQ4365987zbMATH OpenOpenAlexFDO

Authors

Publication date 5 March 1998

Full work available at URL https://doi.org/10.2307/2291713

zbMATH Keywords

image restorationMarkov random fieldselectron microscopyiterative conditional modes

Mathematics Subject Classification ID

Random fields; image analysis (62M40) Applications of statistics (62P99) Survival analysis and censored data (62N99)

Recommendations

• Bayesian image analysis
• Bayesian image restoration, with two applications in spatial statistics (with discussion)
• Statistical-mechanical approach to image processing
• A statistical approach to identifying closed object boundaries in images

Cited in

(9)

• Laplacian image contrast in mirror electron microscopy
• Expectations of random sets and their boundaries using oriented distance functions
• The use of Bayesian analysis to the model of energy loss in magnetic materials
• Progressive Image Transmission in Telemicroscopy: A Quantitative Approach for Electron Microscopy Images of Biological Specimens
• Estimation of the Head Sensitivity Function in Scanning Magnetoresistance Microscopy
• Optimization problems in electron microscopy of single particles
• Three-dimensional Bayesian image analysis and confocal microscopy
• Inference on binary images from binary data
• A statistical approach to identifying closed object boundaries in images

This page was built for publication: An Image Analysis Problem in Electron Microscopy

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4365987)