An Inequality Characterizes the Trace
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(29)- Characterizations of the trace
- On generalized Powers-Størmer's inequality
- On weighted monotonicity inequalities and characterizations of the traces
- Trace inequalities for Rickart \(C^{\ast}\)-algebras
- Characterization of certain traces on von Neumann algebras
- Metrics on projections of the von Neumann algebra associated with tracial functionals
- Characterization of tracial functionals on von Neumann algebras
- Projections and traces on von Neumann algebras
- Trace and differences of idempotents in \(C^\ast\)-algebras
- Inequality for a trace on a unital C^-algebra
- Matrix monotone functions and the generalized Powers-Størmer inequality
- On a parametric family of distance measures that includes the Hellinger and the Bures distances
- Weighted monotonicity inequalities for traces on operator algebras
- Commutation of projections and trace characterization on von Neumann algebras. II.
- Characterization of tracial functionals by inequalities for the spread of a matrix
- Generalisation of Michelson contrast for operators and its properties
- Characterizations of tracial functionals on C^-algebras
- Around the near order relation on the positive definite cone of a C^-algebra
- Characterizations of tracial functionals on matrix and operator algebras
- The Peierls-Bogoliubov inequality in \(C^\ast\)-algebras and characterization of tracial functionals
- Trace inequalities and characterizations of tracial functionals in operator algebras
- Characterization of tracial functionals on von Neumann algebras
- Characterization of tracial functionals on a von Neumann algebra by inequalities for power functions
- Inequalities for a trace on a C^*-algebra and their applications
- A trace interpolation and characterizations of tracial positive linear functionals
- Characterization of central elements of operator algebras by inequalities
- Characterization of the trace by monotonicity inequalities
- Spectra and variance of quantum random variables
- Commutation of projections and characterization of traces on von Neumann algebras. III
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