An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time

DOI10.1109/TC.2016.2561920MaRDI QIDQ2989534zbMATH OpenWikidataFDO

Authors Hyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang

Publication date 8 June 2017

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/TC.2016.2561920

Mathematics Subject Classification ID

Detection theory in information and communication theory (94A13)

Cited in

(1)

• On a New Mechanism of Trigger Generation for Post-Silicon Debugging

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