Analysis and application of exponential degradation paths with random failure thresholds

DOI10.3969/J.ISSN.1000-5641.201811040MaRDI QIDQ5127611zbMATH OpenOpenAlexFDO

Authors Qiang Guan, Zhiliang Fu

Publication date 27 October 2020

Full work available at URL https://jglobal.jst.go.jp/en/detail?JGLOBAL_ID=202002215645302888

zbMATH Keywords

exponential functionfailure distributioninterval degradation modelnumerical integrationreliability

Mathematics Subject Classification ID

Reliability and life testing (62N05) Applications of statistics in engineering and industry; control charts (62P30)

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Cited in

(1)

• Hierarchical Bayesian change-point analysis for nonlinear degradation data

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