Analysis of Reliability Dynamics of SSD RAID

DOI10.1109/TC.2014.2349505MaRDI QIDQ2985512zbMATH OpenFDO

Authors Yongkun Li, Patrick P. C. Lee, John C. S. Lui

Publication date 16 May 2017

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/TC.2014.2349505

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

Cited in

(2)

• Chip-Level RAID with Flexible Stripe Size and Parity Placement for Enhanced SSD Reliability
• Robustness in SSD portfolio efficiency testing

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