Analysis of the Signal Reliability Measure and an Evaluation Procedure

DOI10.1109/TC.1979.1675326MaRDI QIDQ4186229zbMATH OpenOpenAlexFDO

Authors Israel Koren

Publication date 1979

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.1979.1675326

zbMATH Keywords

Combinational CircuitsFanout-Free CircuitsFunctional ReliabilityProbability of Fault-OccurrenceSignal Reliability

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Cited in

(1)

• Modified and extended inspection models

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