Asymptotic efficiencies of truncated sequential tests

DOI10.1109/TIT.1982.1056578MaRDI QIDQ3962368zbMATH OpenOpenAlexFDO

Authors Sawasd Tantaratana, H. Vincent Poor

Publication date 1982

Published in IEEE Transactions on Information Theory (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tit.1982.1056578

zbMATH Keywords

asymptotic efficienciesaverage sample sizeprobability ratio testtesting location parametertruncated sequential tests

Mathematics Subject Classification ID

Sequential statistical analysis (62L10)

Cited in

(3)

• Truncated sequential CFAR detectors using weighted sign and weighted conditional sign tests
• A class of truncated sequential nonparametric tests with constant boundaries: Design and Performance
• Acquisition of PN sequences for DS/SS systems using a truncated sequential probability ratio test

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