Automatic surface inspection using wavelet reconstruction

DOI10.1016/S0031-3203(00)00071-6MaRDI QIDQ5950298zbMATH OpenOpenAlexFDO

Authors Du-Ming Tsai, Bo Hsiao

Publication date 2 May 2002

Published in Pattern Recognition (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/s0031-3203(00)00071-6

zbMATH Keywords

image reconstructionmultiresolution analysissurface inspection

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10) Computing methodologies for image processing (68U10) Computing methodologies and applications (68U99)

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Cites work

• A theory for multiresolution signal decomposition: the wavelet representation
• Biorthogonal bases of compactly supported wavelets
• Decomposition of Hardy Functions into Square Integrable Wavelets of Constant Shape
• scientific article; zbMATH DE number 914370 (Why is no real title available?)
• Ondelettes et bases hilbertiennes. (Wavelets and Hilbert bases)
• Orthonormal bases of compactly supported wavelets
• Ten Lectures on Wavelets
• The generalized Gabor scheme of image representation in biological and machine vision
• Theory of regular M-band wavelet bases

Cited in

(11)

• Wavelet analysis-based texture analysis of ceramic surface images
• The use of Haar wavelets in detecting and localizing texture defects
• Defect detecting in multi-element photodetector by wavelets and neural networks
• Feature extraction of sewer pipe defects using wavelet transform and co-occurrence matrix
• An efficient technique to detect visual defects in particleboards
• Local Detection Of Defects From Image Sequences
• A refined flexible inspection method for identifying surface flaws using the skeleton and neural network
• Wavelet-based approach for ball grid array (BGA) substrate conduct paths inspection
• scientific article; zbMATH DE number 2044004 (Why is no real title available?)
• APPLICATION OF WAVELET-BASED SINGULARITY DETECTION TECHNIQUE IN AUTOMATIC INSPECTION SYSTEM
• Wavelet strategy for surface roughness analysis and characterisation

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