Bayesian process monitoring schemes for the two-parameter exponential distribution

DOI10.1080/03610926.2018.1440307MaRDI QIDQ5078375zbMATH OpenOpenAlexWikidataFDO

Authors Robert R. van Zyl, A. J. van der Merwe

Publication date 23 May 2022

Published in Communications in Statistics: Theory and Methods (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/03610926.2018.1440307

zbMATH Keywords

Bayesian procedurecontrol chartJeffrey's priorrun-lengthtwo-parameter exponential distribution

Mathematics Subject Classification ID

Statistics (62-XX)

Cites work

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Cited in

(6)

• An assessment of the effect of using different mappings and Minkowski distances in joint monitoring of the time-between-event processes
• Simultaneous monitoring of origin and scale in left-bounded processes via depth
• Phase-II monitoring of exponentially distributed process based on type-II censored data for a possible shift in location-scale
• An adaptive Bayesian scheme for joint monitoring of process mean and variance
• Some two-sample tests for simultaneously comparing both parameters of the shifted exponential models
• Bayesian process control for Cronbach's alpha

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• StInt

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