Bayesian sequential estimation of the reliability of a parallel-series system
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Abstract: We give a risk-averse solution to the problem of estimating the reliability of a parallel-series system. We adopt a beta-binomial model for components reliabilities, and assume that the total sample size for the experience is fixed. The allocation at subsystems or components level may be random. Based on the sampling schemes for parallel and series systems separately, we propose a hybrid sequential scheme for the parallel-series system. Asymptotic optimality of the Bayes risk associated with quadratic loss is proved with the help of martingale convergence properties.
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Cites work
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Cited in
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- Design of optimal Bayesian reliability test plans for a parallel system based on type-II censoring
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- Reliability modeling of coherent systems with shared components based on sequential order statistics
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- Nearly second order three-stage design for estimating a product of several Bernoulli proportions
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