Circuits for robust designs
From MaRDI portal
Abstract: This paper continues the application of circuit theory to experimental design started by the first two authors. The theory gives a very special and detailed representation of the kernel of the design model matrix. This representation turns out to be an appropriate way to study the optimality criteria referred to as robustness: the sensitivity of the design to the removal of design points. Many examples are given, from classical combinatorial designs to two-level factorial design including interactions. The complexity of the circuit representations are useful because the large range of options they offer, but conversely require the use of dedicated software. Suggestions for speed improvement are made.
Recommendations
Cites work
- scientific article; zbMATH DE number 4089320 (Why is no real title available?)
- scientific article; zbMATH DE number 3675167 (Why is no real title available?)
- scientific article; zbMATH DE number 1313654 (Why is no real title available?)
- scientific article; zbMATH DE number 1560708 (Why is no real title available?)
- scientific article; zbMATH DE number 774837 (Why is no real title available?)
- scientific article; zbMATH DE number 835749 (Why is no real title available?)
- A Randomized Exchange Algorithm for Computing Optimal Approximate Designs of Experiments
- A characterization of saturated designs for factorial experiments
- Computer Construction of "D-Optimal" First-Order Designs
- Design of Comparative Experiments
- Ideals, varieties, and algorithms. An introduction to computational algebraic geometry and commutative algebra
- On greedy heuristics for computing D-efficient saturated subsets
- On the aberrations of mixed level orthogonal arrays with removed runs
- Optimal Additions to and Deletions from Two-Level Orthogonal Arrays
- Orthogonal arrays. Theory and applications
- Robustness of BIBD against the unavailability of data
- Selecting significant effects in factorial designs: Lenth's method versus using negligible interactions
- Self-orthogonal designs and extremal doubly even codes
- The Sequential Generation of $D$-Optimum Experimental Designs
- \(D\)-optimal orthogonal array minus \(t\) run designs
Cited in
(2)
This page was built for publication: Circuits for robust designs
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2093130)