Classifying and explaining defects with small data for the semiconductor industry

DOI10.5802/MSIA.20MaRDI QIDQ2094849zbMATH OpenOpenAlexFDO

Authors Jean-François Boulanger, Franck Corset, Franck Iutzeler, Jérôme Lelong

Publication date 8 November 2022

Published in MathematicS In Action (Search for Journal in Brave)

Copyright license Creative Commons Attribution 4.0 International

Full work available at URL https://doi.org/10.5802/msia.20

Mathematics Subject Classification ID

Computer science (68-XX) Operations research, mathematical programming (90-XX)

Cites work

• A distribution-free theory of nonparametric regression
• Scikit-learn: machine learning in Python

Describes a project that uses

Uses Software

• ElemStatLearn
• Scikit

This page was built for publication: Classifying and explaining defects with small data for the semiconductor industry

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2094849)