Coincidence of two failure rate models

DOI10.1080/03610929308831055MaRDI QIDQ4275802zbMATH OpenOpenAlexFDO

Authors Seiji Nabeya

Publication date 20 January 1994

Published in Communications in Statistics: Theory and Methods (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/03610929308831055

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Cites work

• A tampered failure rate model for step-stress accelerated life test
• Accelerated Life Testing - Step-Stress Models and Data Analyses
• Bayesian estimation and optimal designs in partially accelerated life testing
• scientific article; zbMATH DE number 3312170 (Why is no real title available?)

Cited in

(1)

• Conditions for the coincidence of the TFR, TRV and CE models

This page was built for publication: Coincidence of two failure rate models

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4275802)