Correction to "Syndrome-Testable Design of Combinational Circuits"

DOI10.1109/TC.1980.1675496MaRDI QIDQ3912731zbMATH OpenOpenAlexFDO

Authors Jacob Savir

Publication date 1980

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.1980.1675496

zbMATH Keywords

fan-out-free circuitmintermprime implicantsingle faultstuck-at fault

Mathematics Subject Classification ID

Switching theory, applications of Boolean algebras to circuits and networks (94C11)

This page was built for publication: Correction to "Syndrome-Testable Design of Combinational Circuits"

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q3912731)