Defect detection using feature point matching for non-repetitive patterned images

DOI10.1007/S10044-012-0305-7MaRDI QIDQ903103zbMATH OpenOpenAlexFDO

Authors Hyewon Kim, Suk I. Yoo

Publication date 5 January 2016

Published in PAA. Pattern Analysis and Applications (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/s10044-012-0305-7

zbMATH Keywords

computer visiondefect detectionfeature point matchinginspection

Mathematics Subject Classification ID

Machine vision and scene understanding (68T45) Computing methodologies for image processing (68U10)

Recommendations

• Defect detection in patterned wafers using multichannel scanning electron microscope
• Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition
• One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction
• Defect detection in periodically patterned surfaces using independent component analysis
• scientific article; zbMATH DE number 1954179

Cites work

• Contrast context histogram. An efficient discriminating local descriptor for object recognition and image matching
• Defect detection in patterned wafers using multichannel scanning electron microscope
• Handbook of Mathematical Models in Computer Vision
• scientific article; zbMATH DE number 3231692 (Why is no real title available?)
• Image Alignment and Stitching: A Tutorial
• The evaluation of normalized cross correlations for defect detection

Cited in

(11)

• Detecting defects with image data
• Robotic intelligence for industrial automation: Object flaw auto detection and pattern recognition by object location searching, object alignment, and geometry comparison
• Defect detection of uneven brightness in low-contrast images using basis image representation
• Non-referential, self-compared shape defect inspection for bond pads with deformed shapes
• Modified gamma correction method to enhance ball grid array image for surface defect inspection
• scientific article; zbMATH DE number 5375540 (Why is no real title available?)
• scientific article; zbMATH DE number 1954179 (Why is no real title available?)
• Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition
• A Hybrid Image Alignment System for Fast and Precise Pattern Localization
• One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction
• Defect detection in periodically patterned surfaces using independent component analysis

Describes a project that uses

Uses Software

• PCA-SIFT
• SIFT

This page was built for publication: Defect detection using feature point matching for non-repetitive patterned images

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q903103)