Design of sequential sampling inspection plans with screening based on minimal lattice paths

DOI10.1002/1520-6750(199412)41:7%3C991::AID-NAV3220410710%3E3.0.CO;2-2MaRDI QIDQ4319225zbMATH OpenOpenAlexFDO

Authors Ikuo Arizono, Hiroshi Ohta

Publication date 11 January 1995

Full work available at URL https://doi.org/10.1002/1520-6750(199412)41:7%3C991::aid-nav3220410710%3E3.0.co;2-2

zbMATH Keywords

minimal lattice pathsscreeningsequential sampling plans

Mathematics Subject Classification ID

Sampling theory, sample surveys (62D05) Applications of statistics in engineering and industry; control charts (62P30) Reliability, availability, maintenance, inspection in operations research (90B25)

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(2)

• scientific article; zbMATH DE number 4018191 (Why is no real title available?)
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