Determination of depth-dependent diffraction data: a new approach

DOI10.1107/S0108767304026881MaRDI QIDQ5359190zbMATH OpenWikidataFDO

Authors A. Broadhurst, K. D. Rogers, T. W. Lowe, D. W. Lane

Publication date 22 September 2017

Published in Acta Crystallographica Section A Foundations of Crystallography (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1107/S0108767304026881

zbMATH Keywords

depth profilingFredholm integral equationregularization

Mathematics Subject Classification ID

Fredholm integral equations (45B05) Diffraction, scattering (78A45)

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(4)

• Ambiguity of structure determination from a minimum of diffraction intensities
• Indexing of grazing-incidence X-ray diffraction patterns: the case of fibre-textured thin films
• Frequency analysis for modulation-enhanced powder diffraction
• Application of focal curves for X-ray microdiffraction methods

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