Efficient Algorithms for Testing Semiconductor Random-Access Memories

DOI10.1109/TC.1978.1675150MaRDI QIDQ4170234zbMATH OpenFDO

Authors Ravindra Nair, Satish M. Thatte, Jacob A. Abraham

Publication date 1978

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/TC.1978.1675150

Mathematics Subject Classification ID

Theory of operating systems (68N25) Analysis of algorithms and problem complexity (68Q25) Algorithms in computer science (68W99) Communication, information (94A99)

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