Efficiently testable circuits

DOI10.4230/LIPICS.ITCS.2023.10MaRDI QIDQ6610271zbMATH OpenFDO

Authors Mirza Ahad Baig, Suvradip Chakraborty, Stefan Dziembowski, Małgorzata Gałązka, Tomasz Lizurej, Krzysztof Pietrzak

Publication date 25 September 2024

Full work available at URL https://doi.org/10.4230/LIPICS.ITCS.2023.10

zbMATH Keywords

circuit compilerscircuit integritycircuit testing

Mathematics Subject Classification ID

Networks and circuits as models of computation; circuit complexity (68Q06) Fault detection; testing in circuits and networks (94C12)

Cited in

(1)

• Efficiently testable circuits without conductivity

This page was built for publication: Efficiently testable circuits

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q6610271)