Estimation of σ and the process capability index based on subsamples
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- ON THE ESTIMATION OF σ AND THE PROCESS CAPABILITY INDICES Cp AND Cpm
- scientific article; zbMATH DE number 5077218
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Cites work
- A Note on the Bivariate Chi Distribution
- scientific article; zbMATH DE number 1461443 (Why is no real title available?)
- scientific article; zbMATH DE number 3301950 (Why is no real title available?)
- scientific article; zbMATH DE number 3089518 (Why is no real title available?)
- Lower Confidence Limits on Process Capability Indices Based on the Range
- On the asymptotic distributions of some process capability indices.
- On the distributions of the estimated process capability indices
- Some Approximations to the Percentage Points of the Non-Central t-Distribution
Cited in
(21)- A Bayesian approach for assessing process precision based on multiple samples
- Assessing process capability based on Bayesian approach with subsamples
- Distributions and process capability control charts for \(C_{PU}\) and \(C_{PL}\) using subgroup information
- Select better suppliers based on manufacturing precision for processes with multivariate data
- Approximate tolerance limits for C_p capability chart based on range
- scientific article; zbMATH DE number 5077218 (Why is no real title available?)
- Estimating process capability index C_p after testing equality of variances
- Estimation of process capability indices and their confidence intervals based on subsamples
- Inference on the capability index:Cpm
- Lower confidence bounds for C PU and C PL based on multiple samples with application to production yield assurance
- Bayesian and Shrinkage Estimation of Process Capability IndexCp
- Estimating Process Capability Indices Based on Subsamples for Asymmetric Tolerances
- An Approximation Approach for Making Decisions in Assessing the Capability IndexCpkfrom the Subsamples
- Confidence intervals for the process capability ratio based on robust estimators
- Approximate confidence bounds for the process capability index \(C_{pm}\) based on subsamples
- scientific article; zbMATH DE number 7059425 (Why is no real title available?)
- Estimating process yield based on Spk for multiple samples
- An alternative approach to test process capability for unilateral specification with subsamples
- Performance measurement for a manufacturing system based on quality, cost and time
- Sample size determination for estimating process precision and process loss based on multiple samples with designated accuracy ratio
- Capability adjustment for gamma processes with mean shift consideration in implementing six sigma program
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