Estimation of Archival Lifetime Distribution for Writable Optical Disks from Accelerated Testings

DOI10.1007/978-0-8176-4971-5_24MaRDI QIDQ4562211zbMATH OpenOpenAlexFDO

Authors Wataru Yamamoto, Chiharu Kumazaki, Kazuyuki Suzuki

Publication date 18 December 2018

Published in Mathematical and Statistical Models and Methods in Reliability (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/978-0-8176-4971-5_24

zbMATH Keywords

accelerated lifetime testingEyring modellognormal distribution

Mathematics Subject Classification ID

Reliability and life testing (62N05) Applications of statistics in engineering and industry; control charts (62P30)

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Cites work

• Accelerated life models: modeling and statistical analysis
• scientific article; zbMATH DE number 1198868 (Why is no real title available?)
• scientific article; zbMATH DE number 1862734 (Why is no real title available?)
• Planning Accelerated Life Tests with Two or More Experimental Factors

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Uses Software

• SPLIDA

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