Exact simultaneous location-scale tests for two shifted exponential samples.
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- scientific article; zbMATH DE number 4058630
Cites work
- scientific article; zbMATH DE number 3338262 (Why is no real title available?)
- A comparative study of tests for paired lifetime data
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- Estimation in the Exponential Distribution
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- Linear Forms in the Order Statistics from an Exponential Distribution
- Normalization of the origin-shifted exponential distribution for control chart construction
- Parametric bootstrap simultaneous confidence intervals for differences of means from several two-parameter exponential distributions
- Phase I and phase II-control charts for the variance and generalized variance
- Prediction intervals for future records and order statistics coming from two parameter exponential distribution
- Sum of squares of uniform random variables
- Tolerance Limits and Confidence Limits on Reliability for the Two-Parameter Exponential Distribution
Cited in
(5)- The exact power of two-sample location tests based on exceedance statistics against shift alternatives
- A new EWMA chart for simultaneously monitoring the parameters of a shifted exponential distribution
- Some two-sample tests for simultaneously comparing both parameters of the shifted exponential models
- Phase-II monitoring of exponentially distributed process based on type-II censored data for a possible shift in location-scale
- Hypothesis testing on the common location parameter of several shifted exponential distributions: a note
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