Exhaustive Test Pattern Generation with Constant Weight Vectors

DOI10.1109/TC.1983.1676175MaRDI QIDQ3041102zbMATH OpenOpenAlexFDO

Authors Donald T. Tang, Lin Woo

Publication date 1983

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.1983.1676175

zbMATH Keywords

constant weight codesexhaustive testingfault testinglogic testingmultilevel logicscan pathself-testingtest pattern generationVLSI testing

Mathematics Subject Classification ID

Cited in

(6)

• The use of linear sums in exhaustive testing
• On \(n\)-column 0,1-matrices with all \(k\)-projections surjective
• A greedy algorithm to construct covering arrays using a graph representation
• A classification of invariant sets of constant-weight tuples and applications to covering schemes
• Fooling near-maximal decision trees
• Partitioning circuits for improved testability

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