Extended behavioral decomposition for estimating ultrahigh reliability

DOI10.1109/24.75328MaRDI QIDQ3987545zbMATH OpenOpenAlexFDO

Authors Robert Geist

Publication date 28 June 1992

Published in IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/24.75328

zbMATH Keywords

behavioral decompositionestimating ultrahigh reliabilityHARPreliability of life-critical electronic systemssemi-Markov modelX-windowXHARP

Mathematics Subject Classification ID

Reliability and life testing (62N05) Reliability, availability, maintenance, inspection in operations research (90B25)

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