Fast Bayesian Inference for Spatial Mean-Parameterized Conway–Maxwell–Poisson Models
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Cites work
- A fast look-up method for Bayesian mean-parameterised Conway-Maxwell-Poisson regression models
- A Useful Distribution for Fitting Discrete Data: Revival of the Conway–Maxwell–Poisson Distribution
- Algorithm 761: Scattered-data surface fitting that has the accuracy of a cubic polynomial
- Asymptotic equivalence of Bayes cross validation and widely applicable information criterion in singular learning theory
- Bayesian Conway–Maxwell–Poisson regression models for overdispersed and underdispersed counts
- Bayesian inference, model selection and likelihood estimation using fast rejection sampling: the Conway-Maxwell-Poisson distribution
- Dimension Reduction and Alleviation of Confounding for Spatial Generalized Linear Mixed Models
- Double Exponential Families and Their Use in Generalized Linear Regression
- Effects of Residual Smoothing on the Posterior of the Fixed Effects in Disease‐Mapping Models
- Efficient Bayesian inference for COM-Poisson regression models
- Fixed-Width Output Analysis for Markov Chain Monte Carlo
- Generalized Halton sequences in 2008: a comparative study
- scientific article; zbMATH DE number 5954269 (Why is no real title available?)
- Markov chain Monte Carlo: can we trust the third significant figure?
- MCMC using Hamiltonian dynamics
- Mean-parametrized Conway–Maxwell–Poisson regression models for dispersed counts
- Modeling zero-modified count and semicontinuous data in health services research. I: Background and overview
- On Deconfounding Spatial Confounding in Linear Models
- Reparametrization of COM–Poisson regression models with applications in the analysis of experimental data
- Restricted generalized poisson regression model
- Restricted spatial regression in practice: geostatistical models, confounding, and robustness under model misspecification
- Reversible jump Markov chain Monte Carlo computation and Bayesian model determination
- Zero-Inflated Poisson Regression, with an Application to Defects in Manufacturing
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