Finding all solutions of piecewise-linear resistive circuits using simple sign tests

DOI10.1109/81.242330MaRDI QIDQ4307891zbMATH OpenOpenAlexFDO

Authors Kiyotaka Yamamura

Publication date 19 February 1995

Published in IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/81.242330

zbMATH Keywords

algorithmcomputational complexitypiecewise-linear resistive circuitssign testssimultaneous linear equations

Mathematics Subject Classification ID

Analysis of algorithms and problem complexity (68Q25) Analytic circuit theory (94C05)

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• Finding all solutions of a class of nonlinear equations using an improved LP test
• Performance evaluation of the LP test algorithm for finding all solutions of piecewise-linear resistive circuits
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• An efficient algorithm for finding all DC solutions of piecewise-linear circuits
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• An interval method for global non‐linear dc circuit analysis
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