Finding ambiguity groups in low testability analog circuits

DOI10.1109/81.873868MaRDI QIDQ2724344zbMATH OpenOpenAlexFDO

Authors Jing Pang, Stefano Manetti, Maria Cristina Piccirilli, Giulio Fedi, Janusz A. Starzyk

Publication date 15 December 2002

Published in IEEE Transactions on Circuits and Systems. I: Fundamental Theory and Applications (Search for Journal in Brave)

Full work available at URL https://semanticscholar.org/paper/d6378f93fd1b74955102702835a9d4b8a0bbcecd

zbMATH Keywords

ambiguity groupsanalog fault diagnosisanalog system testingQR factorization

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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Cited in

(3)

• Artificial intelligence methods in diagnostics of analog systems
• Algebraic Approach to Ambiguity-Group Determination in Nonlinear Analog Circuits
• Finding of optimal excitation signal for testing of analog electronic circuits

Describes a project that uses

Uses Software

• Matlab

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