Identification of surface impedance of thin dielectric objects from far-field data

DOI10.1088/0266-5611/27/2/025011MaRDI QIDQ3081494zbMATH OpenOpenAlexFDO

Authors Noam Zeev

Publication date 8 March 2011

Published in Inverse Problems (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1088/0266-5611/27/2/025011

zbMATH Keywords

inverse scattering problemsNewton-type methodthin dielectric infinite cylinder

Mathematics Subject Classification ID

Finite difference methods applied to problems in optics and electromagnetic theory (78M20) Inverse problems for PDEs (35R30) Finite difference methods for boundary value problems involving PDEs (65N06) Inverse problems (including inverse scattering) in optics and electromagnetic theory (78A46)

Recommendations

• The Identification of Thin Dielectric Objects from Far Field or Near Field Scattering Data
• The Determination of the Surface Impedance of a Partially Coated Obstacle from Far Field Data
• Stable Determination of the Surface Impedance of an Obstacle by Far Field Measurements
• Stable determination of surface impedance on a rough obstacle by far field data
• On the Determination of the Boundary Impedance from the Far Field Pattern
• Surface impedance determination of a planar boundary by the use of scattering data
• Surface impedance determination of an object located over a planar PEC surface and its use in shape reconstruction
• On the reconstruction of surface impedance from the far-field data in inverse scattering problems
• Inverse scattering for surface impedance from phase-less far field data
• Simultaneous recovery of an infinite rough surface and the impedance from near-field data

Cited in

(13)

• Surface impedance modeling of PEC targets: application to shape reconstruction
• A modified transmission eigenvalue problem for scattering by a partially coated crack
• Detecting and imaging dielectric objects from real data: a shape-based approach
• The Identification of Thin Dielectric Objects from Far Field or Near Field Scattering Data
• The determination of boundary coefficients from far field measurements
• Application of the linear sampling method to identify cracks with impedance boundary conditions
• The determination of anisotropic surface impedance in electromagnetic scattering
• Surface impedance determination of an object located over a planar PEC surface and its use in shape reconstruction
• On the reconstruction of surface impedance from the far-field data in inverse scattering problems
• On the Determination of the Boundary Impedance from the Far Field Pattern
• The factorization method for the inverse scattering problem from thin dielectric objects
• A Free-Space Measurement Method for the Low-Loss Dielectric Characterization Without Prior Need for Sample Thickness Data
• Mathematical framework for multi-frequency identification of thin insulating and small conductive inhomogeneities

This page was built for publication: Identification of surface impedance of thin dielectric objects from far-field data

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q3081494)