Imaging of nanostructures

mathematical model for transmission electron microscopy of nanostructures

Description

We present a mathematical model and a tool chain for the numerical simulation of transmission electron microscopy (TEM) images of semiconductor quantum dots (QDs). This includes elasticity theory to obtain the strain profile coupled with the Darwin–Howie–Whelan equations, describing the propagation of the electron wave through the sample. This tool chain can be applied to generate a database of simulated transmission electron microscopy (TEM) images, which is a key element of a novel concept for model-based geometry reconstruction of semiconductor QDs, involving machine learning techniques.

Mathematical models

dynamical electron scattering model

References

Numerical simulation of TEM images for In(Ga)As/GaAs quantum dots with various shapes

Further links

Item	Property
transmission electron microscopy	contains

Edit imaging of nanostructures item

This page was built for research problem: imaging of nanostructures