Importance sampling for determining SRAM yield and optimization with statistical constraint

DOI10.1007/978-3-642-22453-9_5MaRDI QIDQ2902762zbMATH OpenOpenAlexFDO

Authors T. S. Doorn, Th. Beelen, Jan ter Maten, Olaf Wittich, A. Di Bucchianico

Publication date 22 August 2012

Published in Scientific Computing in Electrical Engineering SCEE 2010 (Search for Journal in Brave)

Full work available at URL https://research.tue.nl/nl/publications/49ddc992-e024-4b9f-9b94-43731bb15837

zbMATH Keywords

large deviation theoryMonte Carlo samplingstatic random access memory (SRAM)

Mathematics Subject Classification ID

Large deviations (60F10) Monte Carlo methods applied to problems in optics and electromagnetic theory (78M31) Optimization problems in optics and electromagnetic theory (78M50) Sampling theory in information and communication theory (94A20)

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Cites work

• Extreme value theory. An introduction.
• Introduction to rare event simulation.

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