Measurement of the thermal transport properties of dielectric thin films using the micro-Raman method (Q1045558)

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Measurement of the thermal transport properties of dielectric thin films using the micro-Raman method
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    Measurement of the thermal transport properties of dielectric thin films using the micro-Raman method (English)
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    15 December 2009
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    thermal conductivity
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    dielectric thin films
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    submicrometer- or nanometer-scale
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    porous silicon
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    thermal effect micro-systems (TEMS)
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