A numerical study of electro-migration voiding by evolving level set functions on a fixed Cartesian grid (Q1306116)
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scientific article; zbMATH DE number 1343451
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| English | A numerical study of electro-migration voiding by evolving level set functions on a fixed Cartesian grid |
scientific article; zbMATH DE number 1343451 |
Statements
A numerical study of electro-migration voiding by evolving level set functions on a fixed Cartesian grid (English)
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22 September 1999
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finite difference method
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numerical examples
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surface diffusion
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electric current
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metal conducting line
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moving boundaries
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fourth order nonlinear partial differential equation
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modified immersed interface method
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fixed Cartesian grid
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electrical field
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local level set method
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moving voids
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electromigration
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0.8498219847679138
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0.795563280582428
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0.7940201759338379
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