On the design of reliable Boolean circuits that contain partially unreliable gates (Q1384528)
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scientific article; zbMATH DE number 1140552
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| English | On the design of reliable Boolean circuits that contain partially unreliable gates |
scientific article; zbMATH DE number 1140552 |
Statements
On the design of reliable Boolean circuits that contain partially unreliable gates (English)
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4 August 1998
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short-circuit model of gate failure
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0.8346491456031799
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0.8240121006965637
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0.8103896379470825
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0.8088866472244263
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