Test pattern generation effort evaluation of reversible circuits (Q1705602)
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scientific article; zbMATH DE number 6850921
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | Test pattern generation effort evaluation of reversible circuits |
scientific article; zbMATH DE number 6850921 |
Statements
Test pattern generation effort evaluation of reversible circuits (English)
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16 March 2018
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reversible circuit
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ATPG
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SAT
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optimization
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0.8862623
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0.87988555
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0.8613123
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0.8500474
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0.8481106
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