Direct sampling method for anomaly imaging from scattering parameter (Q1749466)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Direct sampling method for anomaly imaging from scattering parameter |
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Direct sampling method for anomaly imaging from scattering parameter (English)
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16 May 2018
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direct sampling method
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scattering parameter
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Bessel functions
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simulation results
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