Maximum ease of testability of logic circuits with respect to multiple stuck-on faults (Q1816073)
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scientific article; zbMATH DE number 948722
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | Maximum ease of testability of logic circuits with respect to multiple stuck-on faults |
scientific article; zbMATH DE number 948722 |
Statements
Maximum ease of testability of logic circuits with respect to multiple stuck-on faults (English)
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18 December 1996
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testability of logic circuits
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multiple stuck-on faults
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synthesis
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abstract finite automaton
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0.87545526
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0.8742783
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0.8700261
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0.8647512
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0.85969937
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0.85951793
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0.8584968
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0.85737526
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0.8572009
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