Maximum ease of testability of logic circuits with respect to multiple stuck-on faults (Q1816073)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Maximum ease of testability of logic circuits with respect to multiple stuck-on faults |
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Maximum ease of testability of logic circuits with respect to multiple stuck-on faults (English)
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18 December 1996
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testability of logic circuits
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multiple stuck-on faults
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synthesis
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abstract finite automaton
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