On the influence of noise in the evaluation of the electrical oscillations occurring in the \(\alpha\)-Si/Si(p)/Si(n) device (Q1878235)

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On the influence of noise in the evaluation of the electrical oscillations occurring in the \(\alpha\)-Si/Si(p)/Si(n) device
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    On the influence of noise in the evaluation of the electrical oscillations occurring in the \(\alpha\)-Si/Si(p)/Si(n) device (English)
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    19 August 2004
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