Converting circuits of functional elements into easily testable forms (Q1920123)
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scientific article; zbMATH DE number 918041
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | Converting circuits of functional elements into easily testable forms |
scientific article; zbMATH DE number 918041 |
Statements
Converting circuits of functional elements into easily testable forms (English)
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20 August 1996
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circuit testing
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fault control
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functional elements
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upper bound
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0.8142431974411011
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0.8131533861160278
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0.8076838254928589
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