New insights into error accumulation due to biased particle distribution in semi-implicit particle methods (Q2060130)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | New insights into error accumulation due to biased particle distribution in semi-implicit particle methods |
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New insights into error accumulation due to biased particle distribution in semi-implicit particle methods (English)
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13 December 2021
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MPS method
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free surface
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high order schemes
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error accumulation
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stability
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biased particle distribution
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