Damage and hotspot formation simulation for impact-shear loaded PBXs using combined microcrack and microvoid model (Q2301792)
From MaRDI portal
!
This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use the normal view instead:
scientific article; zbMATH DE number 7173579
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | Damage and hotspot formation simulation for impact-shear loaded PBXs using combined microcrack and microvoid model |
scientific article; zbMATH DE number 7173579 |
Statements
Damage and hotspot formation simulation for impact-shear loaded PBXs using combined microcrack and microvoid model (English)
0 references
25 February 2020
0 references
polymer-bonded explosives
0 references
impact-shear ignition
0 references
void distortion
0 references
shear crack hotspot
0 references
void collapse hotspot
0 references
0 references
0 references
0.7414529919624329
0 references
0.7141615152359009
0 references
0.7081649303436279
0 references
0.7012208104133606
0 references
0.6983366012573242
0 references
