Damage and hotspot formation simulation for impact-shear loaded PBXs using combined microcrack and microvoid model (Q2301792)
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scientific article; zbMATH DE number 7173579
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| English | Damage and hotspot formation simulation for impact-shear loaded PBXs using combined microcrack and microvoid model |
scientific article; zbMATH DE number 7173579 |
Statements
Damage and hotspot formation simulation for impact-shear loaded PBXs using combined microcrack and microvoid model (English)
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25 February 2020
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polymer-bonded explosives
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impact-shear ignition
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void distortion
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shear crack hotspot
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void collapse hotspot
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0.7414529919624329
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0.7141615152359009
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0.7081649303436279
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0.7012208104133606
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0.6983366012573242
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