Polynomial identity testing for depth 3 circuits (Q2472430)
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scientific article; zbMATH DE number 5237956
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | Polynomial identity testing for depth 3 circuits |
scientific article; zbMATH DE number 5237956 |
Statements
Polynomial identity testing for depth 3 circuits (English)
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22 February 2008
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identity testing
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depth of circuits
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Chinese remainder
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rings
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0.8954753
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0.8835454
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0.8806558
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0.87467945
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0.87467945
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0.87427044
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