Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in (Q2875192)

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Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in
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    Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in (English)
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    13 August 2014
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    arithmetic circuits
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    bounded depth circuits
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    derandomization
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    identity testing
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    multilinear circuits
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