Deterministic identity testing of depth-\(4\) multilinear circuits with bounded top fan-in (Q2875192)
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scientific article; zbMATH DE number 6330105
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| English | Deterministic identity testing of depth-\(4\) multilinear circuits with bounded top fan-in |
scientific article; zbMATH DE number 6330105 |
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13 August 2014
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arithmetic circuits
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bounded depth circuits
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derandomization
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identity testing
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multilinear circuits
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0.9968324
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0.89854133
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0.8985413
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0.8840134
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0.8806006
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0.87222195
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0.8682256
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0.8562076
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Deterministic identity testing of depth-\(4\) multilinear circuits with bounded top fan-in (English)
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