Direct and inverse problems of determining the parameters of multilayer nanostructures from the angular spectrum of the intensity of reflected X-rays (Q2995727)
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scientific article; zbMATH DE number 5884271
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| English | Direct and inverse problems of determining the parameters of multilayer nanostructures from the angular spectrum of the intensity of reflected X-rays |
scientific article; zbMATH DE number 5884271 |
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Direct and inverse problems of determining the parameters of multilayer nanostructures from the angular spectrum of the intensity of reflected X-rays (English)
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4 May 2011
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methods for determining parameters of multilayer nanostructures
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mathematical modeling
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finite difference method
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approximation-combinatorial method
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0.8979656100273132
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0.709548830986023
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0.6871334314346313
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0.6841763257980347
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